08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
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9 U' X* `# q* F8 M作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
ISSN:1439-2674
5 u/ F0 O' o6 D  L9 t: XISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
% e$ Z9 j' w4 ^* ]2 u2 ]- x0 f; ~出版商：Springer
2 T: L. _; K) t' n3 g$ B年代：2008
$ m) Q; G) g7 |' {1 L$ mPreface：
Experimental methods for diffraction and microscopy are pushing the front
7 d  a7 B3 }) k3 [edge of nanoscience and materials science, and important new developments
, h% {; N: @; `  X! N) U' Y7 M4 i8 ?are covered in this third edition. For transmission electron microscopy, a remarkable
7 _: [+ x. D  S0 jrecent development has been a practical corrector for the spherical
! S. p: K, {7 _! maberration of the objective lens. Image resolution below 1˚A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
9 |: E6 u" h  J0 ~# Fimproved dramatically. Locating and identifying individual atoms inside materials
- m, b5 x! N$ phas been transformed from a dream of fifty years into experimentalmethods of today.
目录
  w! {) x( n) m% X1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
0 g  K; C0 f& m3 ~) q: U( @7 N1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
1.1.2 Bragg’s Law ..................................... 3
* e9 U  D2 B" f% D- t  O0 X1.1.3 StrainE?ects.................................... 6
( K0 H/ ^* S! R9 D, d1.1.4 SizeE?ects...................................... 7
0 p7 w; _6 }9 Z4 g$ E1.1.5 ASymmetryConsideration ....................... 9
  H/ s9 Q6 S( r  u  T7 D1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
1.2.2 CharacteristicRadiation .......................... 16
1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
) p6 `" F  g/ U  i1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
% k& v, b! k1 \: z& X; _# r. }1.4.1 DetectorPrinciples ............................... 30
) A9 ^& O+ }/ s; t1.4.2 Position-SensitiveDetectors ....................... 34
- J( U# Q6 M8 _' l; x* T( ^1.4.3 ChargeSensitivePreamplifier...................... 36
# u  U6 M3 v; t5 i- Z/ Y1.4.4 OtherElectronics................................. 37
0 I% |, l0 P5 o- p- K9 k4 X' s1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
- Y* b" }: j0 o" \/ N4 b! b1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
1.5.3 LatticeParameterMeasurement.................... 49
( j- ~/ E$ R8 |# O1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
5 C9 a. }6 D) S8 Z& h& IFurtherReading............................................ 54
Problems .................................................. 55
- O% T4 G, ?/ U6 [2 G2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
) o/ }) J& B& p; s1 m) `2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
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. C; b+ V- U" t( |+ ]8 p共24个压缩卷，解压后45.5M
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- }5 I7 O! k: K5 Y) U- y! F[ 本帖最后由 fenglianxiang 于 2008-7-27 11:00 编辑 ]