08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
& F* q! Q! {- K- ]6 h: S
# c3 n/ Z) t$ Z1 h: t作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
  }+ U0 f, E; c# @# X7 iISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
$ W0 a% R. D. L; GISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
* t4 T" b4 F* u) e) }出版商：Springer
年代：2008
Preface：
0 e; M- ?3 D* ]- F$ A$ h. cExperimental methods for diffraction and microscopy are pushing the front
" P% C) h4 J5 G, ?- Xedge of nanoscience and materials science, and important new developments
6 D% I" f- L+ _" B; ^are covered in this third edition. For transmission electron microscopy, a remarkable
" |$ c) }2 K, Z  S! b! [5 nrecent development has been a practical corrector for the spherical
$ {# m, @$ r5 R9 Kaberration of the objective lens. Image resolution below 1˚A can be achieved
. Q" w7 U& m1 d: J) Rregularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
- |% d) C" r. g1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
: G+ G! M3 k9 f, d, x( m# |8 k1.1.2 Bragg’s Law ..................................... 3
( A- v( x7 H! A; B& D7 S1.1.3 StrainE?ects.................................... 6
1.1.4 SizeE?ects...................................... 7
2 Y+ E; C0 n3 \' X1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
# x  ?8 G* J# m' N# V2 s1.1.7 ExperimentalMethods............................ 10
2 O: s3 j4 ?0 G0 {1.2 TheCreationofX-Rays................................. 13
: Q6 U9 v& {) L" D) I1.2.1 Bremsstrahlung.................................. 14
/ f9 t2 V; ^9 K1 m8 f7 t1.2.2 CharacteristicRadiation .......................... 16
# ]! y5 c) p) ]& f6 p  a1.2.3 SynchrotronRadiation............................ 20
# J/ |" u( R  f1.3 TheX-RayPowderDi?ractometer........................ 23
% Q& F: W- d$ [% G. j1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1 w7 M2 Z6 A1 _1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
' J0 H; {  S3 d1.4.3 ChargeSensitivePreamplifier...................... 36
* {- V+ J9 s2 k$ s: i1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
" @4 j! ^- H( W1 n1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
. F6 x, R9 s: T+ A. e1.5.3 LatticeParameterMeasurement.................... 49
1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
  C6 O3 O) P4 T( jProblems .................................................. 55
2. The TEM and its Optics.................................. 61
; l8 I' {. F* J2.1 Introduction to the Transmission Electron Microscope....... 61
5 M& U5 M$ ?; v2.2 WorkingwithLensesandRayDiagrams................... 66
$ y" b* t8 F) q+ `* C2.2.1 SingleLenses .................................... 66
3 B8 l' Q, U! _$ D& S.....................
共24个压缩卷，解压后45.5M

5 Z& R$ I2 @1 O1 y5 y$ e8 W[ 本帖最后由 fenglianxiang 于 2008-7-27 11:00 编辑 ]