08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！

) H. ?. b- d9 B" M& w2 w% e" I作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
# d8 `. m' {; {* l1 VISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
4 {5 v/ z7 Z) s* p2 P8 s3 q; j7 eISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
, x# y! H! x& Y) m出版商：Springer
年代：2008
7 g) |# u/ \9 Q# m# F7 TPreface：
2 ~5 h6 [! P% x! r3 v3 bExperimental methods for diffraction and microscopy are pushing the front
edge of nanoscience and materials science, and important new developments
3 R+ A" \3 n* m3 }) [2 H6 Pare covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
# P1 `# _2 B. m6 G1 Y7 O! Lregularly now, and the energy resolution of electron spectrometry has also
improved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
$ n4 U: }) b9 W) e' p- B1.1 Di?raction............................................. 1
2 V- t. E3 u. Z$ k- ^: z0 r! S1.1.1 IntroductiontoDi?raction ........................ 1
1 a/ v7 h  v7 t. R( f  u" r6 u1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
7 y8 G- A  U* T* u4 X3 R1.1.4 SizeE?ects...................................... 7
+ Z! E, W6 A: o& \1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
- E8 w+ f$ i6 q0 `. s1 k; E1.2 TheCreationofX-Rays................................. 13
7 E- ?+ ]) G; ?, ^' v& H: M; D& _1.2.1 Bremsstrahlung.................................. 14
- D  j( T, V5 |6 L) n) x+ h1.2.2 CharacteristicRadiation .......................... 16
1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
& ~5 n# c% A' A, k1.3.1 PracticeofX-RayGeneration...................... 23
3 s1 }; I# B) c: q# W' r, }1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
- [7 `* a; S7 e6 ~1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
4 X5 a: p. n, s' P) z, k* P1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
% p3 O$ A) G: o5 @4 G. O4 E! _1.4.4 OtherElectronics................................. 37
5 y2 d* t( B0 @; `0 T9 q; M" o1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
6 H. R/ C$ X4 w  {. f1.5.2 PhaseFractionMeasurement ...................... 45
1.5.3 LatticeParameterMeasurement.................... 49
" @' I2 h( `: k7 N1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
  H- z9 z/ _  n6 _( |: H# jProblems .................................................. 55
2. The TEM and its Optics.................................. 61
8 ^* f- o7 D* |1 s4 b  n2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
# h  b9 q- e: I/ K2.2.1 SingleLenses .................................... 66
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共24个压缩卷，解压后45.5M
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