08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
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作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
ISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
1 Q  [7 U" f; d- k+ o, k. G9 _9 U出版商：Springer
年代：2008
Preface：
Experimental methods for diffraction and microscopy are pushing the front
% `4 ~3 [/ R5 Y+ G4 Eedge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
3 w2 Z/ |. r* T( ?. @* Precent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
  T: o  X7 L5 j1 x2 {2 h( Cimproved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
' m- }3 ?6 w: N目录
5 b5 x; o/ t. f2 P  z3 s# X2 Y/ T1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
1 E  L# s/ U+ F. ~4 J1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
' c: }7 r7 z" a3 P8 c1.1.4 SizeE?ects...................................... 7
1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
- N# S1 h6 p/ |; V. ~1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
! Z/ s, I) ^# M# s1.2.2 CharacteristicRadiation .......................... 16
1 e. L) T1 f# }( k( @8 V1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
2 v% @( }, p) P. T$ p0 r1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
3 m! ?6 `% ^6 H" X! h- o$ Z2 |1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
7 `5 |* t7 N) m4 L9 R/ z8 E2 H$ V# N1.4.3 ChargeSensitivePreamplifier...................... 36
1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
% Q1 n2 S1 q6 b% N0 e5 p$ V6 T1.5.2 PhaseFractionMeasurement ...................... 45
4 P6 M8 ~& Q7 h" i, k1.5.3 LatticeParameterMeasurement.................... 49
8 ~/ B+ @3 O4 ^) b* D  L$ ^4 r1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
2. The TEM and its Optics.................................. 61
# W' Q' `2 l( t- T- \, _& p4 I2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
. y( ^8 \& K( C% C: s.....................
共24个压缩卷，解压后45.5M

" |# j" B+ M4 M! q( V5 v5 l[ 本帖最后由 fenglianxiang 于 2008-7-27 11:00 编辑 ]