08新书Transmission ElectronMicroscopy and Diffractometry of Materials

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透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！

" a+ g/ a- O0 T* t' c/ U作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
% Z3 K3 t8 e) x; {; J* Q. tISSN:1439-2674
) O+ r; J( ]# G+ R- uISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
出版商：Springer
  p4 W/ y$ n# j, R9 }8 i年代：2008
1 o! [2 i/ i6 y: g! yPreface：
( b- f$ H& X3 K$ d8 u2 c0 pExperimental methods for diffraction and microscopy are pushing the front
2 J) ]6 Q7 \% K# V2 sedge of nanoscience and materials science, and important new developments
are covered in this third edition. For transmission electron microscopy, a remarkable
- U% R- V# R$ @recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
regularly now, and the energy resolution of electron spectrometry has also
# E. d& s) B9 gimproved dramatically. Locating and identifying individual atoms inside materials
has been transformed from a dream of fifty years into experimentalmethods of today.
目录
1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
4 l7 b/ j& n6 Q( f6 n4 l2 f1.1 Di?raction............................................. 1
3 {4 Y9 S) }1 e$ D! x  s, [9 Z  q1.1.1 IntroductiontoDi?raction ........................ 1
1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
# D9 ~& }3 j3 m0 a, R( p1.1.4 SizeE?ects...................................... 7
! J& Y/ g$ s0 T1.1.5 ASymmetryConsideration ....................... 9
1.1.6 MomentumandEnergy ........................... 10
1.1.7 ExperimentalMethods............................ 10
+ V2 M% Y4 M. S/ N1.2 TheCreationofX-Rays................................. 13
1.2.1 Bremsstrahlung.................................. 14
1.2.2 CharacteristicRadiation .......................... 16
* a* Q+ p4 d0 a5 f3 J  B1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
% H) L% E+ w2 i1.4.1 DetectorPrinciples ............................... 30
1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
- W# V* J9 j8 l$ ^3 z1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
( j6 z0 w0 \; d( L5 J9 ?1.5.2 PhaseFractionMeasurement ...................... 45
- e& U: j9 O& v: s% c/ \1.5.3 LatticeParameterMeasurement.................... 49
& P0 i* g5 g0 S/ R5 s1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
Problems .................................................. 55
  n. J: s( R  A' I2. The TEM and its Optics.................................. 61
2 ~" t; h! X! {6 K: e. u2.1 Introduction to the Transmission Electron Microscope....... 61
0 K8 s  o7 M# `2.2 WorkingwithLensesandRayDiagrams................... 66
2.2.1 SingleLenses .................................... 66
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共24个压缩卷，解压后45.5M

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