08新书Transmission ElectronMicroscopy and Diffractometry of Materials

fenglianxiang

透射电镜书籍08年新书《Transmission ElectronMicroscopy and Diffractometry of Materials》3rd Edition！
7 r1 z. }4 q/ S  h# P2 X9 f
作者：Prof. Dr. Brent Fultz；Prof. Dr. James M. Howe
% f( ]" I' r2 \# l9 H+ Z. X! RISSN:1439-2674
ISBN 978-3-540-73885-5 3rdEditionSpringerBerlinHeidelbergNewYork
ISBN 978-3-540-43764-2 2ndEditionSpringerBerlinHeidelbergNewYork
5 ]9 s' a; Y5 \" r0 Y出版商：Springer
! `3 m% f) f" |4 w7 k( Q! O年代：2008
: x# S, A$ c( `8 M/ R7 S" h( [Preface：
% s: v" D2 Y( c: k. n; O3 kExperimental methods for diffraction and microscopy are pushing the front
; c/ `; g( i  e" Z; bedge of nanoscience and materials science, and important new developments
' b( {5 Q5 h/ L# e3 J) Gare covered in this third edition. For transmission electron microscopy, a remarkable
recent development has been a practical corrector for the spherical
aberration of the objective lens. Image resolution below 1˚A can be achieved
& @, ]) D& G" p* U; R: hregularly now, and the energy resolution of electron spectrometry has also
- k! I) B; A7 D! i/ \- {4 z3 Vimproved dramatically. Locating and identifying individual atoms inside materials
& `  Q1 ]/ h* a( W' E6 E% G8 [has been transformed from a dream of fifty years into experimentalmethods of today.
& h; ~- z  ^! z2 b. R目录
% R- y' [1 x& o1. Di?raction and the X-Ray Powder Di?ractometer ........ 1
1.1 Di?raction............................................. 1
1.1.1 IntroductiontoDi?raction ........................ 1
$ h' S2 b3 a( N" |# W; f" X& o1.1.2 Bragg’s Law ..................................... 3
1.1.3 StrainE?ects.................................... 6
3 B# t1 W) P$ O2 P3 S! H1.1.4 SizeE?ects...................................... 7
; k* E: i  l7 T+ h- V) j1.1.5 ASymmetryConsideration ....................... 9
3 m' Z# Y8 p2 ^& _1.1.6 MomentumandEnergy ........................... 10
: [! k5 Y) ]  \  s1.1.7 ExperimentalMethods............................ 10
1.2 TheCreationofX-Rays................................. 13
0 o$ Q4 ~- b5 l' b1.2.1 Bremsstrahlung.................................. 14
& S6 H5 l& `& N1.2.2 CharacteristicRadiation .......................... 16
1.2.3 SynchrotronRadiation............................ 20
1.3 TheX-RayPowderDi?ractometer........................ 23
* b1 u/ c/ m, o& Z6 D9 e1.3.1 PracticeofX-RayGeneration...................... 23
1.3.2 GoniometerforPowderDi?raction ................. 25
* s6 |; G1 i6 Z* o% N1.3.3 Monochromators,Filters,Mirrors................... 28
1.4 X-RayDetectorsforXRDandTEM...................... 30
1.4.1 DetectorPrinciples ............................... 30
+ h3 Y& j4 c# a1.4.2 Position-SensitiveDetectors ....................... 34
1.4.3 ChargeSensitivePreamplifier...................... 36
* p8 n$ }8 M0 e* ^1 Q1.4.4 OtherElectronics................................. 37
1.5 ExperimentalX-RayPowderDi?ractionData.............. 38
1.5.1 *IntensitiesofPowderDi?ractionPeaks ............ 38
1.5.2 PhaseFractionMeasurement ...................... 45
( Z& j. @8 D$ @- J, K! }1.5.3 LatticeParameterMeasurement.................... 49
2 N# b4 c( v7 P1.5.4 * Refinement Methods for Powder Di?raction Data ... 52
FurtherReading............................................ 54
! d; ^, @- G  ~1 w6 `' Q% `" M5 P/ P  sProblems .................................................. 55
2. The TEM and its Optics.................................. 61
2.1 Introduction to the Transmission Electron Microscope....... 61
2.2 WorkingwithLensesandRayDiagrams................... 66
8 B6 i7 y, T) [2.2.1 SingleLenses .................................... 66
: n4 Y1 ~0 Z0 U% P7 N: h.....................
' D' g+ r' H7 ~3 S+ G; E共24个压缩卷，解压后45.5M

[ 本帖最后由 fenglianxiang 于 2008-7-27 11:00 编辑 ]